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Academic conference

  • 국내
    포스터
    한국 물리학회2008 가을 학술 발표대회 Investigation of Energy band alignments in HfO2/GaAs(100) films as a function of post-annealing temperatures.

    한국물리학회

    Lee Sun young, Kim Chung yi, cho mann-ho

  • 국내
    학술발표
    한국 물리학회2008 가을 학술 발표대회 Changes In Physical Properties Of Zr-incorporated Gd2O3 Films Grown On Si(100) By NH3-nitridation

    한국 물리학회

    이우정, 마진원, mann-ho cho

  • 국내
    포스터
    한국 물리학회2008 가을 학술 발표대회 Study Of Interfacial Electronic Structures In P-I-N Heterostructural-Organic-Photovoltaic Cells By X-ray And Ultraviolet Photoelectron Spectroscopies

    한국물리학회

    Park, Sang Han, Jeong, Jin Geol, Cho, Sang Wan, cho mann-ho

  • 국내
    학술발표
    제20차 방사광이용자연구발표회 및 협회정기총회 Phase transition characteristics of Ge2Sb2Te5 and N-incorporated Ge2Sb2Te5

    방사광이용자협회

    장문형, 박승종, mann-ho cho

  • 국내
    학술발표
    제36회 2009년 동계 한국진공학회 학술대회 Study of SrTiO3 for Dielectric Thin Films Grown by Plasma-Enhanced Atomic Layer Deposition

    한국진공학회

    임찬중, 임동혁, 마진원, mann-ho cho, 권학용, 박형상, 유용민, DAE HONG KO

  • 국내
    학술발표
    한국물리학회 2009 봄 학술발표대회 The phase change properties for oxygen incorporated Ge2Sb2Te5

    한국물리학회

    장문형, 박승종, 임동혁, 박성진, mann-ho cho, HYUNCHUL SOHN, DAE HONG KO

  • 국외
    학술발표
    215th ECS Meeting Crystallization Behavior of Laser Induced Ge2Sb2Te5 and N-doped Ge2Sb2Te5 Thin Films

    The Electrochemical Society

    도기훈, 양인석, DAE HONG KO,, mann-ho cho, HYUNCHUL SOHN

  • 국외
    학술발표
    215th ECS Meeting The Effect of NH3 on the Interface of HfO2 and Al2O3 Films on GaAs (100) Surfaces

    The Electrochemical Society

    서동찬, 조영대, DAE HONG KO,, mann-ho cho, Yongshik Lee

  • 국내
    포스터
    E-MRS 2009 Spring Meeting Change in the chemical bonding states and band alignment of silicon oxynitride films as a function of plasma nitride condition

    European Materials Research Society

    Chanjung Yim, Dongwon Lee, mann-ho cho, Chungyi Kim, Jinwon Ma, Sunyoung Lee, Hyoungsub Kim, Hoojung Lee, DAE HONG KO

  • 국외
    학술발표
    E-MRS 2009 spring meeing Changes in physical properties of Zr-incorporated Gd2O3 films grown on various substrate types (SiGe, Ge, Si)

    European Materials Research Society

    W.J. Lee, J.H. Baeck, J.W. Ma, C.Y. Kim, mann-ho cho, D.C. Seo, DAE HONG KO,, H.Kim, H.J. Lee